Ransom’sNotes Ransom Stephens, PhD

Training

“Ransom is that teacher, the one who makes you wish you never left school. -Andy Martwick, Intel

Meet innovative challenges, update

skills, and get an edge!

• Conceptual & rigorous, fascinating & useful • Fit to your schedule: one, two, or three day intensives, lunch-n-learn seminars or webinars - whatever you need • Problem solving and debug skills • Key insights from the physics of technology and neuroscience of innovation to prime your innovation engine • A comfortable atmosphere that connects the dots from previous experience to new technologies

All Training is customized for you and your team

“Intuitive, clear, and simple explanations were given for complicated subject matter. Sharp and witty jester.” –Kamna Ashu, Qualcomm

Understanding, Debugging, and Testing

High Speed I/O

For design, manufacturing, and test engineers, advanced engineering, physics, and math students • Expert-level jitter, noise, and crosstalk analysis o SNDR, TDECQ o RJ, DJ, DDJ, ISI, SJ, PJ, HPBJ, DCD, BUJ, E/OJ o Dual-Dirac model, Q-scale, bathtub plots, and TJ o Eye height and eye width in NRZ/PAM2 and PAM4 signaling o Crosstalk analysis with S-params, eye diagrams, and waveforms o NEXT, FEXT, ICR, IXT, IMR, ICN, and COM • High speed enablers: differential signaling and clock recovery • PAM4 • Dispersion, skin effect, and inter-symbol interference • Thinking in S-parameters: differential/common signaling, ISI, crosstalk • Channel evaluation: COM and ERL • Equalization techniques at the transmitter and receiver o Adaptive link training, Tx & Rx FFE, CTLE, DFE • High speed metrology, embedding/de-embedding • Diagnostic tools o Serdes and interconnect test techniques o Using test patterns to diagnose clock recovery, equalization, and slicer problems o Oscilloscopes, BERTs, Phase noise analyzers, VNAs, TDR o Stressed eye test techniques o Interference tolerance testing • Overview of emerging high speed standards: 400 GbE, OIF-CEI 4+, PCIe 2-6, 32+ GFC, etc o Tutorial on how to find what you need in a technology standard specification “Excellent! Interesting, lively, inspiring… full of quotable wisdom and humour—beautiful!” – Alan Boulton, Socionext.com

PAM4 Intensive

For design, manufacturing, and test engineers, summary version available for managers and executives • PAM4 challenges in design and test o Signal-to-noise, jitter, crosstalk, and BER analysis of PAM4 signals o Eye compression, RLM, inter-eye skew • How to calculate, measure, and simulate COM (channel operating margin) • Understanding SNDR, TDECQ, COM, and ERL measurements and options • Advanced equalization methods o Skin effect, dispersion, and PCB nuances at very high data rates o Adaptive ink training, Tx & Rx FFE, CTLE, DFE, ADC-based receivers • Multi-dimensional S-parameters and crosstalk • Closed eye analysis: effective jitter and noise • Jitter and noise analysis techniques: tail-fitting, spectral fitting, aperiodic BUJ, etc • Embedding and de-embedding channels, noise sources, equalization, clock recovery, etc “Lively, fun, informative, ‘real’ ” –Kevin James, DisplayLink

Signal and Power Integrity Essentials

For technicians, circuit designers, and advanced engineering, physics, and math students • Reflections, termination, and impedance matching o Transmission lines, drivers o Return path o Timing, parasitics, stubs • PCB o Routing, coupling, capacitors o ESR, ESL, loop inductance, distributed capacitance o Split planes • Crosstalk in microstrip and stripline traces • Differential signaling design considerations o Pros and cons of strong or weak coupling o Delay and skew o Power integrity o Ground bounce & power droop • Simulation: 3D-wave simulation, SPICE, IBIS, AMI • Project based hands-on simulation training “..very accessible due to good diagrams and pacing, and a good information density.” – Ben Janoff, Cambridge Consultants

High Speed Serial Technology for

Executives and Managers

• A lunch seminar designed to provide high-level team members an understanding of the technical challenges facing their companies “Content is very dense but [Ransom] managed to smooth it with such a sense of humour. I never expected not to fall asleep in such a course.” – Ana Ruiz

Optic Fiber Technology and Test

For digital and RF engineers transitioning to fiber optics and silicon photonics, fiber optic technicians, design, manufacturing, and test engineers, advanced engineering, physics, and math students; summary version available for managers and executives • Introduction to Optic Fiber Technology • Optic Fibers as Dielectric Waveguides • Physical Optics and DWDM • Optical Transmitters, Amplifiers, and Receivers • Dispersion • Advanced Topics in Fiber Optic Technology - The Future

Neuroscience-based Innovative

Problem Solving

Guided problem solving sessions guaranteed to generate new approaches to solving any problem your company faces, from debugging to invention to innovation of processes and results. • We use neuroscience-based techniques to guide your team to solutions to any (solvable) problem--one to three day sessions for teams of 2-10 people working on a common project. • Effective ways to brainstorm and find new perspectives • Neural pruning and adopting natural selection’s innovation techniques • Enhanced lateral thought • Understand the neuroscience of what makes discoveries, creations, and products good, bad, and/or valuable

Ransom’sNotes Ransom Stephens, PhD

Training

“Ransom is that teacher, the one who makes you wish you never left school. -Andy Martwick, Intel

Meet innovative

challenges, update skills,

and get an edge!

All Training is customized for you and

your team

“Intuitive, clear, and simple explanations were given for complicated subject matter. Sharp and witty jester.” –Kamna Ashu, Qualcomm

Understanding, Debugging,

and Testing

High Speed I/O

For design, manufacturing, and test engineers, advanced engineering, physics, and math students • Expert-level jitter, noise, and crosstalk analysis o SNDR, TDECQ o RJ, DJ, DDJ, ISI, SJ, PJ, HPBJ, DCD, BUJ, E/OJ o Dual-Dirac model, Q-scale, bathtub plots, and TJ o Eye height and eye width in NRZ/PAM2 and PAM4 signaling o Crosstalk analysis with S-params, eye diagrams, and waveforms o NEXT, FEXT, ICR, IXT, IMR, ICN, and COM • High speed enablers: differential signaling and clock recovery • PAM4 • Dispersion, skin effect, and inter-symbol interference • Thinking in S-parameters: differential/common signaling, ISI, crosstalk • Channel evaluation: COM and ERL • Equalization techniques at the transmitter and receiver o Adaptive link training, Tx & Rx FFE, CTLE, DFE • High speed metrology, embedding/de- embedding • Diagnostic tools o Serdes and interconnect test techniques o Using test patterns to diagnose clock recovery, equalization, and slicer problems o Oscilloscopes, BERTs, Phase noise analyzers, VNAs, TDR o Stressed eye test techniques o Interference tolerance testing • Overview of emerging high speed standards: 400 GbE, OIF-CEI 4+, PCIe 2-6, 32+ GFC, etc o Tutorial on how to find what you need in a technology standard specification “Excellent! Interesting, lively, inspiring… full of quotable wisdom and humour—beautiful!” – Alan Boulton, Socionext.com